🔬 WIA-SEMI-002 Simulator

Interactive Semiconductor Testing Environment

🔬 Wafer Test
📦 Package Test
⚙️ ATE Control
📊 Quality Metrics
📝 Test Logs

Wafer Probe Testing

Wafer Map

Final Package Testing

Test results will appear here...

ATE Equipment Control

Equipment Status

Quality Metrics & Analytics

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Wafer Yield (%)
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Defects Per Million
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Equipment Uptime (%)
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Throughput (wafers/day)

Yield Trend (Last 30 Days)

Click "Generate Quality Report" to view detailed analytics...

Test Execution Logs

[2025-01-15 10:00:00] System initialized. WIA-SEMI-002 v1.0.0