Semiconductor Testing eBook

Eight-chapter learner-focused companion to the WIA-SEMI-TEST-001 standard.

• Chapter 1: ATE Test Program Architecture
• Chapter 2: Wafer Probing
• Chapter 3: Built-In Self Test (BIST)
• Chapter 4: Boundary Scan IEEE 1149 family
• Chapter 5: Stress Tests per JEDEC JESD22
• Chapter 6: Reliability Qualification JESD47
• Chapter 7: Single Event Effects per JESD89
• Chapter 8: AEC-Q100 Automotive Qualification

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